Texas Instruments ADS5545IRGZT

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Product attributes Property Value
Manufacturer Texas Instruments
Product Series
Packaging Marketplace | Cut Tape (CT)
Number of Bits 14
Sampling Rate (Per Second) 170M
Number of Inputs 1
Input Type Differential
Data Interface LVDS - Parallel, Parallel
Configuration S/H-ADC
Ratio - S/H:ADC 1:1
Number of A/D Converters 1
Architecture Pipelined
Reference Type External, Internal
Voltage - Supply, Analog 3V ~ 3.6V
Voltage - Supply, Digital 3V ~ 3.6V
Features -
Operating Temperature -40°C ~ 85°C
Mounting Type Surface Mount
Grade -
Qualification -
Package / Case 48-VFQFN Exposed Pad
Supplier Device Package 48-VQFN (7x7)
ROHS RoHS Compliant - Hazardous Substance Free Electronic Components | HQICKEY

The Texas Instruments ADS5545IRGZT is a high-speed 14-bit analog-to-digital converter (ADC) with a sampling rate of 170M SPS. It features a single channel and a sample-and-hold architecture, ensuring accurate conversion of fast analog signals. The device supports both LVDS - Parallel and Parallel interfaces, providing flexible digital output options. Housed in a 48-VFQFN Exposed Pad package, it operates over -40°C to 85°C, making it suitable for a wide range of industrial and communication applications.

  • Ultra-High Speed: 170M SPS sampling rate captures fast transient signals with ease.
  • High Resolution: 14-bit output ensures detailed signal representation.
  • Flexible Interface: LVDS and parallel outputs allow easy integration with various digital systems.
  • Compact Design: 48-VFQFN package minimizes PCB footprint.

High-Speed Data Acquisition Systems

The 170M SPS sampling rate and 14-bit resolution make this ADC ideal for digitizing high-frequency signals in oscilloscopes and spectrum analyzers.

Wireless Communication Infrastructure

In base stations and software-defined radios, this converter digitizes IF signals with high speed and accuracy, improving signal processing performance.

Medical Ultrasound Imaging

The high sampling rate enables real-time capture of ultrasound echoes, providing detailed images for diagnostic purposes.

Radar and LIDAR Systems

This ADC's speed and resolution support precise range and velocity measurements in automotive and defense radar systems.

Test and Measurement Equipment

With LVDS parallel output, it integrates easily into high-throughput test systems for automated signal analysis.

Q: What is the resolution of the ADS5545IRGZT?
A: It is a 14-bit ADC, offering high-resolution conversion for precise signal analysis.
Q: What is the maximum sampling rate?
A: The sampling rate is 170M SPS, enabling high-speed data acquisition.
Q: How many channels does this ADC have?
A: It has a single (1) input channel.
Q: What interfaces are supported?
A: It supports LVDS - Parallel and Parallel interfaces for flexible digital output.
Q: What is the architecture?
A: It uses a Sample-and-Hold (S/H-ADC) architecture.
Q: What is the package type?
A: It comes in a 48-VFQFN Exposed Pad package.
Base Product Number : ADS5545IRGZT
1 Channel 14-bit 170M SPS 48-VFQFN ADC Analog-to-Digital Converter LVDS Parallel S/H-ADC
Q: What is the resolution of the ADS5545IRGZT?
A: It is a 14-bit ADC, offering high-resolution conversion for precise signal analysis.
Q: What is the maximum sampling rate?
A: The sampling rate is 170M SPS, enabling high-speed data acquisition.
Q: How many channels does this ADC have?
A: It has a single (1) input channel.
Q: What interfaces are supported?
A: It supports LVDS - Parallel and Parallel interfaces for flexible digital output.
Q: What is the architecture?
A: It uses a Sample-and-Hold (S/H-ADC) architecture.
Q: What is the package type?
A: It comes in a 48-VFQFN Exposed Pad package.