BYTe Semiconductor BY25Q05AWTIG(T)

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Product attributes Property Value
Manufacturer BYTe Semiconductor
Product Series
Packaging Tube | Tube
Memory Type Non-Volatile
Memory Format FLASH
Technology FLASH - NOR
Memory Size 512Kbit
Memory Organization 64K x 8
Memory Interface SPI - Quad I/O
Clock Frequency 85 MHz
Write Cycle Time - Word, Page 3ms, 3ms
Access Time 6 ns
Voltage - Supply 1.65V ~ 3.6V
Operating Temperature -40°C ~ 85°C (TA)
Grade -
Qualification -
Mounting Type Surface Mount
Package / Case 8-SOIC (0.154", 3.90mm Width)
Supplier Device Package 8-SOP
ROHS RoHS Compliant - Hazardous Substance Free Electronic Components | HQICKEY

BY25Q05AWTIG(T) - 512Kbit SPI NOR Flash Memory IC

The BY25Q05AWTIG(T) from BYTe Semiconductor is a high-performance 512Kbit SPI NOR Flash memory IC designed for embedded systems requiring reliable non-volatile storage. Featuring Quad I/O SPI interface with 85MHz clock frequency and wide voltage operation (1.65V to 3.6V), this memory solution is ideal for aerospace, automotive, industrial, and telecommunications applications.

Key Features:

  • 512Kbit (64K x 8) NOR Flash memory - Reliable non-volatile storage for critical data
  • SPI Quad I/O interface - High-speed data transfer at 85MHz clock frequency
  • Wide voltage range (1.65V - 3.6V) - Flexible power supply compatibility
  • Industrial temperature range (-40°C to 85°C) - Proven reliability in harsh environments
  • Fast access time (6ns) - Optimized for performance-critical applications
  • Surface mount 8-SOIC package - Space-efficient design for compact PCB layouts

Applications:

This NOR Flash memory IC is well-suited for firmware storage, boot code, configuration data, and data logging in embedded systems across aerospace, automotive ECUs, industrial controllers, and telecommunications equipment.

Authorized Distributor Benefits:

We provide genuine BYTe Semiconductor components with full manufacturer documentation, traceability certificates, and long lifecycle availability to support your design-in programs and mitigate obsolescence risk.